1 code implementation • 7 Jan 2021 • Lu Mi, Hao Wang, Yaron Meirovitch, Richard Schalek, Srinivas C. Turaga, Jeff W. Lichtman, Aravinthan D. T. Samuel, Nir Shavit
Single-beam scanning electron microscopes (SEM) are widely used to acquire massive data sets for biomedical study, material analysis, and fabrication inspection.
