Search Results for author: Daniel H. Slichter

Found 1 papers, 0 papers with code

Measurement of electric-field noise from interchangeable samples with a trapped-ion sensor

no code implementations1 Feb 2021 Kyle S. McKay, Dustin A. Hite, Philip D. Kent, Shlomi Kotler, Dietrich Leibfried, Daniel H. Slichter, Andrew C. Wilson, David P. Pappas

We demonstrate the use of a single trapped ion as a sensor to probe electric-field noise from interchangeable test surfaces.

Atomic Physics

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