no code implementations • 28 Jun 2018 • Tongjie Chen, Kamyar Ahmadi-Majlan, Zheng Hui Lim, Zhan Zhang, Joseph H. Ngai, Alexander F. Kemper, Divine P. Kumah
The interfacial structure of SrZr$_{x}$Ti$_{1-x}$O$_3$ films grown on semiconducting Ge substrates are investigated by synchrotron X-ray diffraction and first-principles density functional theory.
Materials Science
