1 code implementation • 19 Aug 2021 • Mingren Shen, Guanzhao Li, Dongxia Wu, Yudai Yaguchi, Jack C. Haley, Kevin G. Field, Dane Morgan
The system provides analysis of features observed in TEM including both static and dynamic properties using the YOLO-based defect detection module coupled to a geometry analysis module and a dynamic tracking module.
no code implementations • 19 Aug 2021 • Mingren Shen, Guanzhao Li, Dongxia Wu, YuHan Liu, Jacob Greaves, Wei Hao, Nathaniel J. Krakauer, Leah Krudy, Jacob Perez, Varun Sreenivasan, Bryan Sanchez, Oigimer Torres, Wei Li, Kevin Field, Dane Morgan
Electron microscopy is widely used to explore defects in crystal structures, but human detecting of defects is often time-consuming, error-prone, and unreliable, and is not scalable to large numbers of images or real-time analysis.