Search Results for author: Guoyong Shi

Found 1 papers, 0 papers with code

Multilayer Perceptron Based Stress Evolution Analysis under DC Current Stressing for Multi-segment Wires

no code implementations17 May 2022 Tianshu Hou, Peining Zhen, Ngai Wong, Quan Chen, Guoyong Shi, Shuqi Wang, Hai-Bao Chen

Electromigration (EM) is one of the major concerns in the reliability analysis of very large scale integration (VLSI) systems due to the continuous technology scaling.

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