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Found 4 papers, 0 papers with code
Multilayer Perceptron Based Stress Evolution Analysis under DC Current Stressing for Multi-segment Wires
Electromigration (EM) is one of the major concerns in the reliability analysis of very large scale integration (VLSI) systems due to the continuous technology scaling.
A Space-Time Neural Network for Analysis of Stress Evolution under DC Current Stressing
The electromigration (EM)-induced reliability issues in very large scale integration (VLSI) circuits have attracted increased attention due to the continuous technology scaling.
S3-Net: A Fast and Lightweight Video Scene Understanding Network by Single-shot Segmentation
Real-time understanding in video is crucial in various AI applications such as autonomous driving.
DEEPEYE: A Compact and Accurate Video Comprehension at Terminal Devices Compressed with Quantization and Tensorization
As it requires a huge number of parameters when exposed to high dimensional inputs in video detection and classification, there is a grand challenge to develop a compact yet accurate video comprehension at terminal devices.
