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Found 3 papers, 1 papers with code
Statistical Properties of the Entropy from Ordinal Patterns
The ultimate purpose of the statistical analysis of ordinal patterns is to characterize the distribution of the features they induce.
A New Similarity Space Tailored for Supervised Deep Metric Learning
We propose a novel deep metric learning method.
Speckle Reduction with Adaptive Stack Filters
We study the performance of adaptive stack filters when they are applied to speckled imagery, in particular to Synthetic Aperture Radar (SAR) images.
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