Stuck-at Faults in ReRAM Neuromorphic Circuit Array and their Correction through Machine Learning

no code implementations • 15 Feb 2024 • Vedant Sawal, Hiu Yung Wong

In this paper, we study the inference accuracy of the Resistive Random Access Memory (ReRAM) neuromorphic circuit due to stuck-at faults (stuck-on, stuck-off, and stuck at a certain resistive value).

Device Image-IV Mapping using Variational Autoencoder for Inverse Design and Forward Prediction

no code implementations • 3 Apr 2023 • Thomas Lu, Albert Lu, Hiu Yung Wong

Since manifold learning is used, the machine is shown to be robust against noise in the inputs (i. e. using hand-drawn images and noisy IDVG curves) and not confused by weak and irrelevant independent variables.

Vertical GaN Diode BV Maximization through Rapid TCAD Simulation and ML-enabled Surrogate Model

no code implementations • 18 Jul 2022 • Albert Lu, Jordan Marshall, Yifan Wang, Ming Xiao, Yuhao Zhang, Hiu Yung Wong

In this paper, two methodologies are used to speed up the maximization of the breakdown volt-age (BV) of a vertical GaN diode that has a theoretical maximum BV of ~2100V.