Physical Mechanism behind the Hysteresis-free Negative Capacitance Effect in Metal-Ferroelectric-Insulator-Metal Capacitors with Dielectric Leakage and Interfacial Trapped Charges

no code implementations • 4 Dec 2020 • Chia-Sheng Hsu, Sou-Chi Chang, Dmitri E. Nikonov, Ian A. Young, Azad Naeemi

By introducing the dielectric (DE) leakage and interfacial trapped charges, our simulations of the hysteresis loops are in a strong agreement with the experimental measurements, suggesting the existence of an interfacial oxide layer at the FE-metal interface in metal-ferroelectric-metal (MFM) capacitors.

Applied Physics

Convolutional Networks for Image Processing by Coupled Oscillator Arrays

no code implementations • 15 Sep 2014 • Dmitri E. Nikonov, Ian A. Young, George I. Bourianoff

A coupled oscillator array is shown to approximate convolutions with Gabor filters for image processing tasks.