no code implementations • 23 Jan 2019 • Jonathan Schwartz, Yi Jiang, Yongjie Wang, Anthony Aiello, Pallab Bhattacharya, Hui Yuan, Zetian Mi, Nabil Bassim, Robert Hovden
Highly-directional image artifacts such as ion mill curtaining, mechanical scratches, or image striping from beam instability degrade the interpretability of micrographs.
