no code implementations • 27 Sep 2018 • Kazybek Adam, Kamilya Smagulova, Olga Krestinskaya, Alex Pappachen James
The automated wafer inspection and quality control is a complex and time-consuming task, which can speed up using neuromorphic memristive architectures, as a separate inspection device or integrating directly into sensors.
no code implementations • 10 Sep 2018 • Kazybek Adam, Kamilya Smagulova, Alex Pappachen James
allows to model systems with multiple input variables and control several parameters such as the size of the look-back window to make a prediction and number of time steps to be predicted.