1 code implementation • 18 Oct 2018 • Xin Li, Ondrej E. Dyck, Mark P. Oxley, Andrew R. Lupini, Leland McInnes, John Healy, Stephen Jesse, Sergei V. Kalinin
Four-dimensional scanning transmission electron microscopy (4D-STEM) of local atomic diffraction patterns is emerging as a powerful technique for probing intricate details of atomic structure and atomic electric fields.
