no code implementations • 19 Apr 2024 • Zhongyi Lin, Ning Sun, Pallab Bhattacharya, Xizhou Feng, Louis Feng, John D. Owens
Characterizing and predicting the training performance of modern machine learning (ML) workloads on compute systems with compute and communication spread between CPUs, GPUs, and network devices is not only the key to optimization and planning but also a complex goal to achieve.
no code implementations • 8 Jan 2023 • Geet Sethi, Pallab Bhattacharya, Dhruv Choudhary, Carole-Jean Wu, Christos Kozyrakis
Sequence-based deep learning recommendation models (DLRMs) are an emerging class of DLRMs showing great improvements over their prior sum-pooling based counterparts at capturing users' long term interests.
no code implementations • 12 Apr 2021 • Dheevatsa Mudigere, Yuchen Hao, Jianyu Huang, Zhihao Jia, Andrew Tulloch, Srinivas Sridharan, Xing Liu, Mustafa Ozdal, Jade Nie, Jongsoo Park, Liang Luo, Jie Amy Yang, Leon Gao, Dmytro Ivchenko, Aarti Basant, Yuxi Hu, Jiyan Yang, Ehsan K. Ardestani, Xiaodong Wang, Rakesh Komuravelli, Ching-Hsiang Chu, Serhat Yilmaz, Huayu Li, Jiyuan Qian, Zhuobo Feng, Yinbin Ma, Junjie Yang, Ellie Wen, Hong Li, Lin Yang, Chonglin Sun, Whitney Zhao, Dimitry Melts, Krishna Dhulipala, KR Kishore, Tyler Graf, Assaf Eisenman, Kiran Kumar Matam, Adi Gangidi, Guoqiang Jerry Chen, Manoj Krishnan, Avinash Nayak, Krishnakumar Nair, Bharath Muthiah, Mahmoud khorashadi, Pallab Bhattacharya, Petr Lapukhov, Maxim Naumov, Ajit Mathews, Lin Qiao, Mikhail Smelyanskiy, Bill Jia, Vijay Rao
Deep learning recommendation models (DLRMs) are used across many business-critical services at Facebook and are the single largest AI application in terms of infrastructure demand in its data-centers.
no code implementations • 23 Jan 2019 • Jonathan Schwartz, Yi Jiang, Yongjie Wang, Anthony Aiello, Pallab Bhattacharya, Hui Yuan, Zetian Mi, Nabil Bassim, Robert Hovden
Highly-directional image artifacts such as ion mill curtaining, mechanical scratches, or image striping from beam instability degrade the interpretability of micrographs.