no code implementations • 27 Feb 2023 • Wenrui Li, Venkatesh Sridhar, K. Aditya Mohan, Saransh Singh, Jean-Baptiste Forien, Xin Liu, Gregery T. Buzzard, Charles A. Bouman
As computational tools for X-ray computed tomography (CT) become more quantitatively accurate, knowledge of the source-detector spectral response is critical for quantitative system-independent reconstruction and material characterization capabilities.