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Synthetic training data generation for deep learning based quality inspection
In order to detect defects, supervised learning is often utilized, but necessitates a large amount of annotated images, which can be costly: collecting, cleaning, and annotating the data is tedious and limits the speed at which a system can be deployed as everything the system must detect needs to be observed first.
How should a fixed budget of dwell time be spent in scanning electron microscopy to optimize image quality?
In scanning electron microscopy, the achievable image quality is often limited by a maximum feasible acquisition time per dataset.
Space-Filling Curve Indices as Acceleration Structure for Exemplar-Based Inpainting
The approach has the advantage of being agnostic to most modelbased parts of exemplar-based inpainting such as the order in which patches are processed and the cost function used to determine patch similarity.
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