Search Results for author: Willie F. Tobin

Found 1 papers, 0 papers with code

ssEMnet: Serial-section Electron Microscopy Image Registration using a Spatial Transformer Network with Learned Features

no code implementations25 Jul 2017 Inwan Yoo, David G. C. Hildebrand, Willie F. Tobin, Wei-Chung Allen Lee, Won-Ki Jeong

The alignment of serial-section electron microscopy (ssEM) images is critical for efforts in neuroscience that seek to reconstruct neuronal circuits.

Image Registration

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