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Found 4 papers, 0 papers with code
Tensor-based process control and monitoring for semiconductor manufacturing with unstable disturbances
This paper proposes a novel process control and monitoring method for the complex structure of high-dimensional image-based overlay errors (modeled in tensor form), which are collected in semiconductor manufacturing processes.
MFRL-BI: Design of a Model-free Reinforcement Learning Process Control Scheme by Using Bayesian Inference
Design of process control scheme is critical for quality assurance to reduce variations in manufacturing systems.
Reinforcement Learning for Process Control with Application in Semiconductor Manufacturing
Process control is widely discussed in the manufacturing process, especially for semiconductor manufacturing.
A Two-stage Pricing Strategy Considering Learning Effects and Word-of-Mouth
This paper proposes a two-stage pricing strategy for nondurable (such as typical electronics) products, where retail price is cut down at certain time points of the product lifecycle.
