Deep Learning Enabled Strain Mapping of Single-Atom Defects in 2D Transition Metal Dichalcogenides with Sub-picometer Precision

22 Jan 2020Chia-Hao LeeAbid KhanDi LuoTatiane P. SantosChuqiao ShiBlanka E. JanicekSangmin KangWenjuan ZhuNahil A. SobhAndré SchleifeBryan K. ClarkPinshane Y. Huang

2D materials offer an ideal platform to study the strain fields induced by individual atomic defects, yet challenges associated with radiation damage have so-far limited electron microscopy methods to probe these atomic-scale strain fields. Here, we demonstrate an approach to probe single-atom defects with sub-picometer precision in a monolayer 2D transition metal dichalcogenide, WSe$_{2-2x}$Te$_{2x}$... (read more)

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