End-to-End Refinement Guided by Pre-trained Prototypical Classifier

7 May 2018Junwen BaiZihang LaiRunzhe YangYexiang XueJohn GregoireCarla Gomes

Many real-world tasks involve identifying patterns from data satisfying background or prior knowledge. In domains like materials discovery, due to the flaws and biases in raw experimental data, the identification of X-ray diffraction patterns (XRD) often requires a huge amount of manual work in finding refined phases that are similar to the ideal theoretical ones... (read more)

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