Fast IR Drop Estimation with Machine Learning

26 Nov 2020  ·  Zhiyao Xie, Hai Li, Xiaoqing Xu, Jiang Hu, Yiran Chen ·

IR drop constraint is a fundamental requirement enforced in almost all chip designs. However, its evaluation takes a long time, and mitigation techniques for fixing violations may require numerous iterations. As such, fast and accurate IR drop prediction becomes critical for reducing design turnaround time. Recently, machine learning (ML) techniques have been actively studied for fast IR drop estimation due to their promise and success in many fields. These studies target at various design stages with different emphasis, and accordingly, different ML algorithms are adopted and customized. This paper provides a review to the latest progress in ML-based IR drop estimation techniques. It also serves as a vehicle for discussing some general challenges faced by ML applications in electronics design automation (EDA), and demonstrating how to integrate ML models with conventional techniques for the better efficiency of EDA tools.

PDF Abstract
No code implementations yet. Submit your code now

Datasets


  Add Datasets introduced or used in this paper

Results from the Paper


  Submit results from this paper to get state-of-the-art GitHub badges and help the community compare results to other papers.

Methods


No methods listed for this paper. Add relevant methods here