Generalization in Metric Learning: Should the Embedding Layer be the Embedding Layer?

8 Mar 2018 Nam Vo James Hays

This work studies deep metric learning under small to medium scale data as we believe that better generalization could be a contributing factor to the improvement of previous fine-grained image retrieval methods; it should be considered when designing future techniques. In particular, we investigate using other layers in a deep metric learning system (besides the embedding layer) for feature extraction and analyze how well they perform on training data and generalize to testing data... (read more)

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