How should a fixed budget of dwell time be spent in scanning electron microscopy to optimize image quality?

12 Jan 2018Patrick TrampertFaysal BourghorbelPavel PotocekMaurice PeemenChristian SchlinkmannTim DahmenPhilipp Slusallek

In scanning electron microscopy, the achievable image quality is often limited by a maximum feasible acquisition time per dataset. Particularly with regard to three-dimensional or large field-of-view imaging, a compromise must be found between a high amount of shot noise, which leads to a low signal-to-noise ratio, and excessive acquisition times... (read more)

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