Intracranial Error Detection via Deep Learning

4 May 2018Martin VölkerJiří HammerRobin T. SchirrmeisterJoos BehnckeLukas D. J. FiedererAndreas Schulze-BonhagePetr MarusičWolfram BurgardTonio Ball

Deep learning techniques have revolutionized the field of machine learning and were recently successfully applied to various classification problems in noninvasive electroencephalography (EEG). However, these methods were so far only rarely evaluated for use in intracranial EEG... (read more)

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