Sampling Limits for Electron Tomography with Sparsity-exploiting Reconstructions

4 Apr 2019Yi JiangElliot PadgettRobert HovdenDavid A. Muller

Electron tomography (ET) has become a standard technique for 3D characterization of materials at the nano-scale. Traditional reconstruction algorithms such as weighted back projection suffer from disruptive artifacts with insufficient projections... (read more)

PDF Abstract

Code


No code implementations yet. Submit your code now

Results from the Paper


  Submit results from this paper to get state-of-the-art GitHub badges and help the community compare results to other papers.

Methods used in the Paper


METHOD TYPE
🤖 No Methods Found Help the community by adding them if they're not listed; e.g. Deep Residual Learning for Image Recognition uses ResNet