Self-Certifying Classification by Linearized Deep Assignment
We propose a novel class of deep stochastic predictors for classifying metric data on graphs within the PAC-Bayes risk certification paradigm. Classifiers are realized as linearly parametrized deep assignment flows with random initial conditions. Building on the recent PAC-Bayes literature and data-dependent priors, this approach enables (i) to use risk bounds as training objectives for learning posterior distributions on the hypothesis space and (ii) to compute tight out-of-sample risk certificates of randomized classifiers more efficiently than related work. Comparison with empirical test set errors illustrates the performance and practicality of this self-certifying classification method.
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CIFAR-10
Fashion-MNIST
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