no code implementations • 27 Feb 2024 • Xiaoyu Liu, Beitong Zhou, Cheng Cheng
However, CRL is mainly used as a pre-training technique, leading to a complicated multi-stage training pipeline.
no code implementations • CVPR 2023 • Beitong Zhou, Jing Lu, Kerui Liu, Yunlu Xu, Zhanzhan Cheng, Yi Niu
Recent developments of the application of Contrastive Learning in Semi-Supervised Learning (SSL) have demonstrated significant advancements, as a result of its exceptional ability to learn class-aware cluster representations and the full exploitation of massive unlabeled data.
no code implementations • 10 Dec 2021 • Sen Zhao, Yong Zhang, Shang Wang, Beitong Zhou, Cheng Cheng
Data-driven methods for remaining useful life (RUL) prediction normally learn features from a fixed window size of a priori of degradation, which may lead to less accurate prediction results on different datasets because of the variance of local features.
no code implementations • 25 Sep 2019 • Jun Liu, Beitong Zhou, Weigao Sun, Ruijuan Chen, Claire J. Tomlin, Ye Yuan
In this paper, we propose a novel technique for improving the stochastic gradient descent (SGD) method to train deep networks, which we term \emph{PowerSGD}.
no code implementations • 1 Apr 2019 • Wenqian Jiang, Cheng Cheng, Beitong Zhou, Guijun Ma, Ye Yuan
This paper proposes a novel fault diagnosis approach based on generative adversarial networks (GAN) for imbalanced industrial time series where normal samples are much larger than failure cases.
no code implementations • 2 Mar 2019 • Cheng Cheng, Beitong Zhou, Guijun Ma, Dongrui Wu, Ye Yuan
However, for diverse working conditions in the industry, deep learning suffers two difficulties: one is that the well-defined (source domain) and new (target domain) datasets are with different feature distributions; another one is the fact that insufficient or no labelled data in target domain significantly reduce the accuracy of fault diagnosis.
no code implementations • 17 Dec 2018 • Ye Yuan, Guijun Ma, Cheng Cheng, Beitong Zhou, Huan Zhao, Hai-Tao Zhang, Han Ding
A central challenge in manufacturing sector lies in the requirement of a general framework to ensure satisfied diagnosis and monitoring performances in different manufacturing applications.