Search Results for author: Bryan Sanchez

Found 1 papers, 0 papers with code

Multi defect detection and analysis of electron microscopy images with deep learning

no code implementations19 Aug 2021 Mingren Shen, Guanzhao Li, Dongxia Wu, YuHan Liu, Jacob Greaves, Wei Hao, Nathaniel J. Krakauer, Leah Krudy, Jacob Perez, Varun Sreenivasan, Bryan Sanchez, Oigimer Torres, Wei Li, Kevin Field, Dane Morgan

Electron microscopy is widely used to explore defects in crystal structures, but human detecting of defects is often time-consuming, error-prone, and unreliable, and is not scalable to large numbers of images or real-time analysis.

Defect Detection

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