no code implementations • 11 Feb 2020 • Maxim Ziatdinov, Chris Nelson, Xiaohang Zhang, Rama Vasudevan, Eugene Eliseev, Anna N. Morozovska, Ichiro Takeuchi, Sergei V. Kalinin
Machine learning has emerged as a powerful tool for the analysis of mesoscopic and atomically resolved images and spectroscopy in electron and scanning probe microscopy, with the applications ranging from feature extraction to information compression and elucidation of relevant order parameters to inversion of imaging data to reconstruct structural models.
Materials Science