Search Results for author: Jack C. Haley

Found 1 papers, 1 papers with code

A Deep Learning Based Automatic Defect Analysis Framework for In-situ TEM Ion Irradiations

1 code implementation19 Aug 2021 Mingren Shen, Guanzhao Li, Dongxia Wu, Yudai Yaguchi, Jack C. Haley, Kevin G. Field, Dane Morgan

The system provides analysis of features observed in TEM including both static and dynamic properties using the YOLO-based defect detection module coupled to a geometry analysis module and a dynamic tracking module.

Defect Detection object-detection +1

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