no code implementations • 3 Aug 2021 • Qijuan Jie, Xichao Zhan, Feng Shu, Yaohui Ding, Baihua Shi, YiFan Li, Jiangzhou Wang
The test statistic (TS) of the first method is defined as the ratio of maximum eigen-value (Max-EV) to minimum eigen-value (R-MaxEV-MinEV) while that of the second one is defined as the ratio of Max-EV to noise variance (R-MaxEV-NV).