Noisy-label Learning with Sample Selection based on Noise Rate Estimate

31 May 2023  ·  Arpit Garg, Cuong Nguyen, Rafael Felix, Thanh-Toan Do, Gustavo Carneiro ·

Noisy-labels are challenging for deep learning due to the high capacity of the deep models that can overfit noisy-label training samples. Arguably the most realistic and coincidentally challenging type of label noise is the instance-dependent noise (IDN), where the labelling errors are caused by the ambivalent information present in the images. The most successful label noise learning techniques to address IDN problems usually contain a noisy-label sample selection stage to separate clean and noisy-label samples during training. Such sample selection depends on a criterion, such as loss or gradient, and on a curriculum to define the proportion of training samples to be classified as clean at each training epoch. Even though the estimated noise rate from the training set appears to be a natural signal to be used in the definition of this curriculum, previous approaches generally rely on arbitrary thresholds or pre-defined selection functions to the best of our knowledge. This paper addresses this research gap by proposing a new noisy-label learning graphical model that can easily accommodate state-of-the-art (SOTA) noisy-label learning methods and provide them with a reliable noise rate estimate to be used in a new sample selection curriculum. We show empirically that our model integrated with many SOTA methods can improve their results in many IDN benchmarks, including synthetic and real-world datasets.

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