Probabilistic Modeling of Deep Features for Out-of-Distribution and Adversarial Detection

25 Sep 2019Nilesh A. AhujaIbrahima NdiourTrushant KalyanpurOmesh Tickoo

We present a principled approach for detecting out-of-distribution (OOD) and adversarial samples in deep neural networks. Our approach consists in modeling the outputs of the various layers (deep features) with parametric probability distributions once training is completed... (read more)

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