no code implementations • 4 Apr 2023 • Sergei V. Kalinin, Debangshu Mukherjee, Kevin M. Roccapriore, Ben Blaiszik, Ayana Ghosh, Maxim A. Ziatdinov, A. Al-Najjar, Christina Doty, Sarah Akers, Nageswara S. Rao, Joshua C. Agar, Steven R. Spurgeon
Machine learning (ML) has become critical for post-acquisition data analysis in (scanning) transmission electron microscopy, (S)TEM, imaging and spectroscopy.