no code implementations • 12 May 2023 • Shoieb Ahmed Chowdhury, M. F. N. Taufique, Jing Wang, Marissa Masden, Madison Wenzlick, Ram Devanathan, Alan L Schemer-Kohrn, Keerti S Kappagantula
We combine scanning electron microscopy (SEM) images of 347H stainless steel as training data and electron backscatter diffraction (EBSD) micrographs as pixel-wise labels for grain boundary detection as a semantic segmentation task.