no code implementations • 4 Mar 2021 • Colum M. O'Leary, Benedikt Haas, Christoph T. Koch, Peter D. Nellist, Lewys Jones
4D-STEM, in which the 2D diffraction plane is captured for each 2D scan position in the scanning transmission electron microscope (STEM) using a pixelated detector, is complementing and increasingly replacing existing imaging approaches.
Instrumentation and Detectors Materials Science
