no code implementations • 16 Jul 2021 • E. Lavrik, M. Shiroya, H. R. Schmidt, A. Toia, J. M. Heuser
From this, defective strips and defect clusters were identified, as well as a 2D map of the defects using their geometrical positions on the sensor was performed.
no code implementations • 30 Jun 2018 • E. Lavrik, I. Panasenko, H. R. Schmidt
We describe a setup for optical quality assurance of silicon microstrip sensors.