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Found 2 papers, 2 papers with code
Accelerated deep self-supervised ptycho-laminography for three-dimensional nanoscale imaging of integrated circuits
Two scanning operations are required: ptychographic to recover the complex transmissivity of the specimen; and rotation of the specimen to acquire multiple projections covering the 3D spatial frequency domain.
Attentional Ptycho-Tomography (APT) for three-dimensional nanoscale X-ray imaging with minimal data acquisition and computation time
Noninvasive X-ray imaging of nanoscale three-dimensional objects, e. g. integrated circuits (ICs), generally requires two types of scanning: ptychographic, which is translational and returns estimates of complex electromagnetic field through ICs; and tomographic scanning, which collects complex field projections from multiple angles.
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