no code implementations • 29 Sep 2021 • Katya Giannios, Abhishek Chaurasia, Bambi DeLaRosa, Guillaume Thibault, Jessica L. Riesterer, Erin S Stempinski, Terence P Lo, Joe W Gray
Recent advances in Focused Ion Beam-Scanning Electron Microscopy (FIB-SEM) allow the imaging and analysis of cellular ultrastructure at nanoscale resolution, but the collection of labels and/or noise-free data sets has several challenges, often immutable.