no code implementations • 19 Jan 2021 • J. Langer, V. Cimalla, M. Prescher, J. Ligl, B. Tegetmeyer, C. Schreyvogel, O. Ambacher
We propose an optimization of the pretreatment process on grounds of high-resolution X-ray diffraction measurements to judge the structural quality gain of the diamond substrates and the effectiveness of the polishing-induced subsurface damage removal.
Materials Science
