The Exit-Wave Power-Cepstrum Transform for Scanning Nanobeam Electron Diffraction: Robust Strain Mapping at Subnanometer Resolution and Subpicometer Precision

2 code implementations • 3 Nov 2019 • Elliot Padgett, Megan E. Holtz, Paul Cueva, Yu-Tsun Shao, Eric Langenberg, Darrell G. Schlom, David A. Muller

However, intensity variations caused by dynamical diffraction and sample mistilts can hinder the measurement of diffracted disk centers as necessary for quantification.

Materials Science Mesoscale and Nanoscale Physics