no code implementations • 7 Dec 2021 • Nana Kankam Gyimah, Abenezer Girma, Mahmoud Nabil Mahmoud, Shamila Nateghi, Abdollah Homaifar, Daniel Opoku
Our approach uses a combination of Non-Local (NL) means filter with wavelet thresholding and Completed Local Binary Pattern (CLBP) to extract robust features which are fed into classifiers for surface defects detection.