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SenseAI: Real-Time Inpainting for Electron Microscopy
Despite their proven success and broad applicability to Electron Microscopy (EM) data, joint dictionary-learning and sparse-coding based inpainting algorithms have so far remained impractical for real-time usage with an Electron Microscope.
Subsampling Methods for Fast Electron Backscattered Diffraction Analysis
Despite advancements in electron backscatter diffraction (EBSD) detector speeds, the acquisition rates of 4-Dimensional (4D) EBSD data, i. e., a collection of 2-dimensional (2D) diffraction maps for every position of a convergent electron probe on the sample, is limited by the capacity of the detector.
A Targeted Sampling Strategy for Compressive Cryo Focused Ion Beam Scanning Electron Microscopy
Simulations on artificial compressive FIB-SEM measurements validate the success of proposed methods: the operational electron dose can be reduced by up to 20 times.
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