no code implementations • 13 Mar 2023 • Bangjian Zhou, Pan Jieming, Maheswari Sivan, Aaron Voon-Yew Thean, J. Senthilnath
Our proposed method achieved an overall accuracy of 86. 66% and compared with the second-best existing method it improves 15. 50% on the GAA-FET dislocation defect dataset.
