An Incremental Phase Mapping Approach for X-ray Diffraction Patterns using Binary Peak Representations

1 code implementation • 8 Nov 2022 • Dipendra Jha, K. V. L. V. Narayanachari, Ruifeng Zhang, Justin Liao, Denis T. Keane, Wei-keng Liao, Alok Choudhary, Yip-Wah Chung, Michael Bedzyk, Ankit Agrawal

Despite the huge advancement in knowledge discovery and data mining techniques, the X-ray diffraction (XRD) analysis process has mostly remained untouched and still involves manual investigation, comparison, and verification.

Clustering X-Ray Diffraction (XRD)