Machine Learning-enhanced Efficient Spectroscopic Ellipsometry Modeling

no code implementations • 1 Jan 2022 • Ayush Arunachalam, S. Novia Berriel, Parag Banerjee, Kanad Basu

The proposed approach has tremendous implications of faster data acquisition, reduced hardware complexity and easier integration of spectroscopic ellipsometry for in situ monitoring of film thickness deposition.

BIG-bench Machine Learning Drug Discovery