STEM image analysis based on deep learning: identification of vacancy defects and polymorphs of ${MoS_2}$

no code implementations • 9 Jun 2022 • Kihyun Lee, Jinsub Park, Soyeon Choi, Yangjin Lee, Sol Lee, Joowon Jung, Jong-Young Lee, Farman Ullah, Zeeshan Tahir, Yong Soo Kim, Gwan-Hyoung Lee, Kwanpyo Kim

Scanning transmission electron microscopy (STEM) is an indispensable tool for atomic-resolution structural analysis for a wide range of materials.