Deep Learning Enables Large Depth-of-Field Images for Sub-Diffraction-Limit Scanning Superlens Microscopy

no code implementations • 27 Oct 2023 • Hui Sun, Hao Luo, Feifei Wang, Qingjiu Chen, Meng Chen, Xiaoduo Wang, Haibo Yu, Guanglie Zhang, Lianqing Liu, JianPing Wang, Dapeng Wu, Wen Jung Li

Scanning electron microscopy (SEM) is indispensable in diverse applications ranging from microelectronics to food processing because it provides large depth-of-field images with a resolution beyond the optical diffraction limit.

Defect Detection Image-to-Image Translation +1