no code implementations • 23 Apr 2024 • Qian Xu, Kai Chen, Xueqi Shen, Lei Xing, Yi Huang, Tian Hong Loh
By counting the number of pass/fail occurrences of a DUT (Device under Test) in the stirring process in a reverberation chamber (RC), the threshold electric field (E-field) level can be well estimated without tuning the input power and repeating the whole testing many times.
