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Device Fault Prediction Model based on LSTM and Random Forest
For purpose of complete the above tasks, this paper investigates the use of Long Short-Term Memory (LSTM) algorithms for quality prediction in material equipment based on key inspection parameters.
Sampling Model for Grid Material Inspection Based on Analytic Hierarchy Process with Absolute Measurement
For purpose of complete the above tasks, this paper investigates the use of Long Short-Term Memory (LSTM) algorithms for quality prediction in material equipment based on key inspection parameters.
Correlation analysis technique of key parameters for transformer material inspection based on FP-tree and knowledge graph
Given the above problems, this paper aims to mine the relationship between the unqualified distribution transformer inspection items by using the association rule algorithm based on the distribution transformer inspection data collected from 2017 to 2021 and sorting out the key inspection items.
