Evaluating the Robustness of Test Selection Methods for Deep Neural Networks
Testing deep learning-based systems is crucial but challenging due to the required time and labor for labeling collected raw data. To alleviate the labeling effort, multiple test selection methods have been proposed where only a subset of test data needs to be labeled while satisfying testing requirements. However, we observe that such methods with reported promising results are only evaluated under simple scenarios, e.g., testing on original test data. This brings a question to us: are they always reliable? In this paper, we explore when and to what extent test selection methods fail for testing. Specifically, first, we identify potential pitfalls of 11 selection methods from top-tier venues based on their construction. Second, we conduct a study on five datasets with two model architectures per dataset to empirically confirm the existence of these pitfalls. Furthermore, we demonstrate how pitfalls can break the reliability of these methods. Concretely, methods for fault detection suffer from test data that are: 1) correctly classified but uncertain, or 2) misclassified but confident. Remarkably, the test relative coverage achieved by such methods drops by up to 86.85%. On the other hand, methods for performance estimation are sensitive to the choice of intermediate-layer output. The effectiveness of such methods can be even worse than random selection when using an inappropriate layer.
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CIFAR-10
CIFAR-100
MNIST
SVHN
